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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 1 — Jan. 1, 2007
  • pp: 25–35

Synchrotron radiation-based irradiance calibration from 200 to 400 nm at the Synchrotron Ultraviolet Radiation Facility III

Ping-Shine Shaw, Uwe Arp, Robert D. Saunders, Dong-Joo Shin, Howard W. Yoon, Charles E. Gibson, Zhigang Li, Albert C. Parr, and Keith R. Lykke  »View Author Affiliations

Applied Optics, Vol. 46, Issue 1, pp. 25-35 (2007)

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A new facility for measuring irradiance in the UV was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility as the primary standard. To measure the irradiance from a source under test, an integrating sphere spectrometer–detector system measures both the source under test and the synchrotron radiation sequentially, and the irradiance from the source under test can be determined. In particular, we discuss the calibration of deuterium lamps using this facility from 200 to 400   nm . This facility improves the current NIST UV irradiance scale to a relative measurement uncertainty of 1.2 % ( k = 2 ) .

© 2007 Optical Society of America

OCIS Codes
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(260.7190) Physical optics : Ultraviolet

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: April 26, 2006
Revised Manuscript: July 24, 2006
Manuscript Accepted: August 17, 2006

Ping-Shine Shaw, Uwe Arp, Robert D. Saunders, Dong-Joo Shin, Howard W. Yoon, Charles E. Gibson, Zhigang Li, Albert C. Parr, and Keith R. Lykke, "Synchrotron radiation-based irradiance calibration from 200 to 400 nm at the Synchrotron Ultraviolet Radiation Facility III," Appl. Opt. 46, 25-35 (2007)

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