Fourier transform approach for thickness estimation of reflecting interference filters.
2. Generalized theory
Applied Optics, Vol. 46, Issue 1, pp. 76-83 (2007)
http://dx.doi.org/10.1364/AO.46.000076
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Abstract
A Fourier transform (FT) approach based on the evaluation of optical-density-bandwidth products in the spectral region of interest was recently proposed for the thickness estimation of reflecting thin-film dielectric filters. For simplicity, the initial discussion was limited to a particular type of immersed coating. The theory is generalized to more realistic filter configurations and confirmed by numerical examples. It is shown that good results are possible although the problem is more complex from a FT point of view.
© 2007 Optical Society of America
OCIS Codes
(230.4040) Optical devices : Mirrors
(230.4170) Optical devices : Multilayers
(310.0310) Thin films : Thin films
(310.1620) Thin films : Interference coatings
(310.6860) Thin films : Thin films, optical properties
(350.2460) Other areas of optics : Filters, interference
ToC Category:
Thin Films
History
Original Manuscript: March 21, 2006
Revised Manuscript: July 28, 2006
Manuscript Accepted: September 2, 2006
Citation
Pierre G. Verly, "Fourier transform approach for thickness estimation of reflecting interference filters.
2. Generalized theory," Appl. Opt. 46, 76-83 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-1-76
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