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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 12 — Apr. 20, 2007
  • pp: 2209–2218

Particle-sizing methods: a stationary-phase-based comparison

Zeev Schiffer and Mordechai Deutsch  »View Author Affiliations


Applied Optics, Vol. 46, Issue 12, pp. 2209-2218 (2007)
http://dx.doi.org/10.1364/AO.46.002209


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Abstract

Stationary-phase approximation is used to examine and compare the reliability and interpretability of two main methods of particle sizing. The first method, differential light scattering, regards spherical objects having different refractive indices. Theoretical expressions are obtained, enabling the derivation of optical and geometrical properties of the object from its scattering pattern. The second method, automated microscope imaging, is considered with theoretical implications for the finite aperture of the objective lens. It is shown that, besides the well known Rayleigh resolution limit, finite aperture must affect size measurement due to optical properties of the particles. Simulation and experimental results for both differential light scattering and microscope imaging of polystyrene beads are in good agreement with theory.

© 2007 Optical Society of America

OCIS Codes
(100.2960) Image processing : Image analysis
(110.0180) Imaging systems : Microscopy
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(260.1960) Physical optics : Diffraction theory
(290.5850) Scattering : Scattering, particles

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 29, 2006
Revised Manuscript: November 8, 2006
Manuscript Accepted: December 14, 2006
Published: April 3, 2007

Citation
Zeev Schiffer and Mordechai Deutsch, "Particle-sizing methods: a stationary-phase-based comparison," Appl. Opt. 46, 2209-2218 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-12-2209


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