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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 14 — May. 10, 2007
  • pp: 2688–2702

Application of the SKYRAD Improved Langley plot method for the in situ calibration of CIMEL Sun–sky photometers

Monica Campanelli, Víctor Estellés, Claudio Tomasi, Teruyuki Nakajima, Vincenzo Malvestuto, and José Antonio Martínez-Lozano  »View Author Affiliations

Applied Optics, Vol. 46, Issue 14, pp. 2688-2702 (2007)

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The in situ procedure for determining the solar calibration constants, originally developed for the PREDE Sun–sky radiometers and based on a modified version of the Langley plot, was applied to a CIMEL instrument located in Valencia, Spain, not integrated into AERONET. Taking into account the different mechanical and electronic characteristics of the two radiometers, the method was adapted to the characteristics of the CIMEL instrument. The iterative procedure for the determination of the solar calibration constants was applied to a 3-year data set. The results were compared with the two sets of experimental calibration constants determined during this period using the standard Langley plot method. The agreement was found to be consistent with the experimental errors, and the method can definitely also be used to determine the solar calibration constant for the CIMEL instrument, improving its calibration. The method can be used provided the radiometer is previously calibrated for diffuse radiance using a standard lamp.

© 2007 Optical Society of America

OCIS Codes
(010.1110) Atmospheric and oceanic optics : Aerosols
(010.1290) Atmospheric and oceanic optics : Atmospheric optics

ToC Category:
Atmospheric and ocean optics

Original Manuscript: August 30, 2006
Revised Manuscript: December 18, 2006
Manuscript Accepted: December 20, 2006
Published: April 23, 2007

Monica Campanelli, Víctor Estellés, Claudio Tomasi, Teruyuki Nakajima, Vincenzo Malvestuto, and José Antonio Martínez-Lozano, "Application of the SKYRAD Improved Langley plot method for the in situ calibration of CIMEL Sun-sky photometers," Appl. Opt. 46, 2688-2702 (2007)

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