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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 15 — May. 20, 2007
  • pp: 2859–2862

Evaluation of two-dimensional displacement components of symmetrical deformation by phase-shifting electronic speckle pattern interferometry

Ping Sun  »View Author Affiliations


Applied Optics, Vol. 46, Issue 15, pp. 2859-2862 (2007)
http://dx.doi.org/10.1364/AO.46.002859


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Abstract

A method for the isolation of two-dimensional (2D) displacement components by using one phase map obtained by phase-shifting electronic speckle pattern interferometry (ESPI) is presented. When the typical ESPI is used for displacement measurement, a mixed phase distribution of deformation is measured. If the deformation of the object is symmetrical, two components of deformation can be separated from each other by using the mixed phase distribution. We turn over the mixed phase map first to obtain the second phase map, and then overlap them. Two displacement components can be separated from each other by boundary alignment and algebraic calculation between the two phase maps. This method has been proved feasible by a typical three-point bending experiment. Some experimental results are offered and compared with the results obtained by a dual-beam symmetrical illuminations experiment. This technique presented provides an alternative approach to 2D deformation measurement.

© 2007 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 6, 2006
Revised Manuscript: January 2, 2007
Manuscript Accepted: January 23, 2007
Published: May 1, 2007

Citation
Ping Sun, "Evaluation of two-dimensional displacement components of symmetrical deformation by phase-shifting electronic speckle pattern interferometry," Appl. Opt. 46, 2859-2862 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-15-2859


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References

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