OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 15 — May. 20, 2007
  • pp: 2859–2862

Evaluation of two-dimensional displacement components of symmetrical deformation by phase-shifting electronic speckle pattern interferometry

Ping Sun  »View Author Affiliations


Applied Optics, Vol. 46, Issue 15, pp. 2859-2862 (2007)
http://dx.doi.org/10.1364/AO.46.002859


View Full Text Article

Enhanced HTML    Acrobat PDF (532 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A method for the isolation of two-dimensional (2D) displacement components by using one phase map obtained by phase-shifting electronic speckle pattern interferometry (ESPI) is presented. When the typical ESPI is used for displacement measurement, a mixed phase distribution of deformation is measured. If the deformation of the object is symmetrical, two components of deformation can be separated from each other by using the mixed phase distribution. We turn over the mixed phase map first to obtain the second phase map, and then overlap them. Two displacement components can be separated from each other by boundary alignment and algebraic calculation between the two phase maps. This method has been proved feasible by a typical three-point bending experiment. Some experimental results are offered and compared with the results obtained by a dual-beam symmetrical illuminations experiment. This technique presented provides an alternative approach to 2D deformation measurement.

© 2007 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 6, 2006
Revised Manuscript: January 2, 2007
Manuscript Accepted: January 23, 2007
Published: May 1, 2007

Citation
Ping Sun, "Evaluation of two-dimensional displacement components of symmetrical deformation by phase-shifting electronic speckle pattern interferometry," Appl. Opt. 46, 2859-2862 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-15-2859

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited