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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 16 — Jun. 1, 2007
  • pp: 3253–3262

Multiple-step triangular-pattern phase shifting and the influence of number of steps and pitch on measurement accuracy

Peirong Jia, Jonathan Kofman, and Chad English  »View Author Affiliations

Applied Optics, Vol. 46, Issue 16, pp. 3253-3262 (2007)

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We present new extensions of the two-step, triangular-pattern phase-shifting method for different numbers of phase-shifting steps to increase measurement accuracy and to analyze the influence of the number of phase-shifting steps and pitch of the projected triangular intensity-profile pattern on the measurement accuracy. Phase-shifting algorithms to generate the intensity ratio, essential for surface reconstruction, were developed for each measurement method. Experiments determined that higher measurement accuracy can be obtained with a greater number of phase-shifting steps and a lower value of pitch, as long as the pitch is appropriately selected to be divisible by the number of phase-shifting steps and not below an optimal value, where intensity-ratio unwrapping failure would occur.

© 2007 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(150.6910) Machine vision : Three-dimensional sensing

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 7, 2006
Revised Manuscript: February 15, 2007
Manuscript Accepted: March 12, 2007
Published: May 15, 2007

Peirong Jia, Jonathan Kofman, and Chad English, "Multiple-step triangular-pattern phase shifting and the influence of number of steps and pitch on measurement accuracy," Appl. Opt. 46, 3253-3262 (2007)

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