Multiple-step triangular-pattern phase shifting and the influence of number of steps and pitch on measurement accuracy
Applied Optics, Vol. 46, Issue 16, pp. 3253-3262 (2007)
http://dx.doi.org/10.1364/AO.46.003253
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Abstract
We present new extensions of the two-step, triangular-pattern phase-shifting method for different numbers of phase-shifting steps to increase measurement accuracy and to analyze the influence of the number of phase-shifting steps and pitch of the projected triangular intensity-profile pattern on the measurement accuracy. Phase-shifting algorithms to generate the intensity ratio, essential for surface reconstruction, were developed for each measurement method. Experiments determined that higher measurement accuracy can be obtained with a greater number of phase-shifting steps and a lower value of pitch, as long as the pitch is appropriately selected to be divisible by the number of phase-shifting steps and not below an optimal value, where intensity-ratio unwrapping failure would occur.
© 2007 Optical Society of America
OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(150.6910) Machine vision : Three-dimensional sensing
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: November 7, 2006
Revised Manuscript: February 15, 2007
Manuscript Accepted: March 12, 2007
Published: May 15, 2007
Citation
Peirong Jia, Jonathan Kofman, and Chad English, "Multiple-step triangular-pattern phase shifting and the influence of number of steps and pitch on measurement accuracy," Appl. Opt. 46, 3253-3262 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-16-3253
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