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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 17 — Jun. 10, 2007
  • pp: 3498–3503

Decoupling refractive index and geometric thickness from interferometric measurements of a quartz sample using a fourth-order polynomial

R. Ince and E. Hüseyinoğlu  »View Author Affiliations

Applied Optics, Vol. 46, Issue 17, pp. 3498-3503 (2007)

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A Michelson interferometer setup was used to determine refractive index and thickness of a fused-quartz sample with no knowledge of either parameter. At small angles, < 10 ° , the interferometer equation follows a fourth-order polynomial in the sample refractive index alone, effectively decoupling the sample thickness from the equation. The incident angle of the He–Ne laser beam versus fringe shift was fitted to the polynomial, and its coefficients obtained. These were used to determine refractive index to within 6 × 10 4 of the known value with an accuracy of ± 1.3 % . Sample thickness was determined to an accuracy of ± 2.5 % . Reproducibility of the rotating table was determined to be ± 2 × 10 3 degrees.

© 2007 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(160.2750) Materials : Glass and other amorphous materials
(220.4840) Optical design and fabrication : Testing

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: December 20, 2006
Revised Manuscript: February 2, 2007
Manuscript Accepted: February 10, 2007
Published: May 18, 2007

R. Ince and E. Hüseyinoglu, "Decoupling refractive index and geometric thickness from interferometric measurements of a quartz sample using a fourth-order polynomial," Appl. Opt. 46, 3498-3503 (2007)

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