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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 19 — Jul. 1, 2007
  • pp: 3958–3968

Widely tunable rapid-scanning mid-infrared laser spectrometer for industrial gas process stream analysis

Douglas J. Bamford, David J. Cook, Scott J. Sharpe, and Aaron D. Van Pelt  »View Author Affiliations


Applied Optics, Vol. 46, Issue 19, pp. 3958-3968 (2007)
http://dx.doi.org/10.1364/AO.46.003958


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Abstract

A mid-infrared spectrometer with a tuning range of > 400 cm 1 in the C–H stretching region of the spectrum has been designed and constructed. The spectrometer is based on the difference-frequency generation of two tunable diode lasers in periodically poled lithium niobate waveguides. Tuning is achieved by varying a single parameter, the wavelength of one of the near-infrared input lasers. The instrument can be tuned over the entire tuning range in less than 1 s. By taking advantage of the wide tuning range, the instrument has been used to analyze a mixture of methane, ethylene, and propylene. Each of these major components was measured with an accuracy of better than 2% (where the error is defined as a percentage of the measured value) in a single 30 s long scan. When optimized, the spectrometer has the potential to meet both the performance requirements and the practical requirements for real-time process control in petrochemical manufacturing. The general principles for the design of mid-infrared spectrometers with wide tuning ranges are explained, including the use of variable waveguide fabrication recipes to create broad phase-matching resonances (which lead to broad tuning) in the desired location.

© 2007 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(190.2620) Nonlinear optics : Harmonic generation and mixing

ToC Category:
Absorption and Cavity-Based Techniques

History
Original Manuscript: October 3, 2006
Manuscript Accepted: January 23, 2007
Published: June 12, 2007

Citation
Douglas J. Bamford, David J. Cook, Scott J. Sharpe, and Aaron D. Van Pelt, "Widely tunable rapid-scanning mid-infrared laser spectrometer for industrial gas process stream analysis," Appl. Opt. 46, 3958-3968 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-19-3958


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