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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 19 — Jul. 1, 2007
  • pp: 4132–4137

Design methodology of refractive index engineering by implantation of high-energy particles in electro-optic materials

Alexander Gumennik, Har'el Ilan, Roei Fathei, Abraham Israel, Aharon J. Agranat, Igal Shachar, and Michael Hass  »View Author Affiliations


Applied Optics, Vol. 46, Issue 19, pp. 4132-4137 (2007)
http://dx.doi.org/10.1364/AO.46.004132


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Abstract

Slab waveguides were constructed in K 1 x L i x T a 1 y N b y O 3 crystals by the implantation of C + 4 12 ions at 30 MeV and O + 5 16 ions at 30 and 40 MeV. The waveguides were characterized by a prism coupler setup. A refractive index drop of 10.9% was observed in a layer formed by the implantation of O + 5 16 ions at 30 MeV. The carbon-implanted waveguides were found to be thermally stable after annealing at 450 °C. A semiempirical formula for predicting the change in the refractive index given the parameters of the implantation process was developed. It is argued that the combination of the basic implantation process with the semiempirical formula can be developed to become a generic method for constructing complex electro-optic circuits with a wave-guided architecture.

© 2007 Optical Society of America

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(160.2260) Materials : Ferroelectrics
(220.4000) Optical design and fabrication : Microstructure fabrication
(230.7400) Optical devices : Waveguides, slab
(350.4600) Other areas of optics : Optical engineering

ToC Category:
Materials

History
Original Manuscript: December 4, 2006
Manuscript Accepted: February 19, 2007
Published: June 12, 2007

Citation
Alexander Gumennik, Harel Ilan, Roei Fathei, Abraham Israel, Aharon J. Agranat, Igal Shachar, and Michael Hass, "Design methodology of refractive index engineering by implantation of high-energy particles in electro-optic materials," Appl. Opt. 46, 4132-4137 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-19-4132

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