OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 21 — Jul. 20, 2007
  • pp: 4613–4624

Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination

Adam Styk and Krzysztof Patorski  »View Author Affiliations


Applied Optics, Vol. 46, Issue 21, pp. 4613-4624 (2007)
http://dx.doi.org/10.1364/AO.46.004613


View Full Text Article

Enhanced HTML    Acrobat PDF (3274 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Two-beam interferogram intensity modulation decoding using spatial carrier phase shifting interferometry is discussed. Single frame recording, simplicity of experimental equipment, and uncomplicated data processing are the main advantages of the method. A comprehensive analysis of the influence of systematic errors (spatial carrier miscalibration, nonuniform average intensity profile, and nonlinear recording) on the modulation distribution determination using automatic fringe pattern analysis techniques is presented. The results of searching for the optimum calculation algorithm are described. Extensive numerical simulations are compared with laboratory findings obtained when testing vibrating silicon microelements under various experimental conditions.

© 2007 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(120.7280) Instrumentation, measurement, and metrology : Vibration analysis

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 22, 2007
Manuscript Accepted: March 26, 2007
Published: July 6, 2007

Citation
Adam Styk and Krzysztof Patorski, "Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination," Appl. Opt. 46, 4613-4624 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-21-4613


Sort:  Year  |  Journal  |  Reset  

References

  1. D. W. Robinson and G. Reid, eds., Interferogram Analysis: Digital Fringe Pattern Measurement (Institute of Physics, 1993).
  2. K. Patorski, Z. Sienicki, and A. Styk, "The phase shifting method contrast calculations in time average interferometry: error analysis," Opt. Eng. 44, 065601 (2005). [CrossRef]
  3. K. Patorski and A. Styk, "Interferogram intensity modulation calculations using temporal phase shifting: error analysis," Opt. Eng. 45, 085602 (2006). [CrossRef]
  4. D. Malacara, M. Servin, and Z. Malacara, Interferogram Analysis for Optical Testing (Dekker, 1998).
  5. S. Petitgrand, R. Yahiaoui, K. Danaie, A. Bosseboeuf, and J. P. Gilles, "3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope," Opt. Lasers Eng. 36, 77-101 (2001). [CrossRef]
  6. K. Creath and J. Schmitt, "N-point spatial phase-measurement techniques for non-destructive testing," Opt. Lasers Eng. 24, 365-379 (1996). [CrossRef]
  7. S. Petitgrand, R. Yahiaoui, A. Bosseboeuf, and K. Danaie, "Quantitative time-averaged microscopic interferometry for micromechanical device vibration mode characterization," Proc. SPIE 4400, 51-60 (2001). [CrossRef]
  8. M. Servin and F. J. Cuevas, "A novel technique for spatial phase-shifting interferometry," J. Mod. Opt. 42, 1853-1862 (1995). [CrossRef]
  9. K. G. Larkin, "Efficient nonlinear algorithm for envelope detection in white light interferometry," J. Opt. Soc. Am. A 13, 832-843 (1996). [CrossRef]
  10. J. Schmit and K. Creath, "Extended averaging technique for derivation of error-compensating algorithms in phase-shifting interferometry," Appl. Opt. 34, 3610-3619 (1995). [CrossRef] [PubMed]
  11. K. Hibino, "Susceptibility of systematic error-compensating algorithms to random noise in phase-shifting interferometry," Appl. Opt. 36, 2084-2093 (1997), and references therein. [CrossRef] [PubMed]
  12. J. Schwider, R. Burrow, K. E. Elssner, J. Grzanna, R. Spolaczyk, and K. Merkel, "Digital wavefront measuring interferometry: some systematic error sources," Appl. Opt. 22, 3421-3432 (1983). [CrossRef] [PubMed]
  13. P. Hariharan, B. Oreb, and T. Eiju, "Digital phase-shifting interferometry: a simple error compensating phase calculation algorithm," Appl. Opt. 26, 2504-2505 (1987). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited