OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 21 — Jul. 20, 2007
  • pp: 4613–4624

Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination

Adam Styk and Krzysztof Patorski  »View Author Affiliations


Applied Optics, Vol. 46, Issue 21, pp. 4613-4624 (2007)
http://dx.doi.org/10.1364/AO.46.004613


View Full Text Article

Enhanced HTML    Acrobat PDF (3274 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Two-beam interferogram intensity modulation decoding using spatial carrier phase shifting interferometry is discussed. Single frame recording, simplicity of experimental equipment, and uncomplicated data processing are the main advantages of the method. A comprehensive analysis of the influence of systematic errors (spatial carrier miscalibration, nonuniform average intensity profile, and nonlinear recording) on the modulation distribution determination using automatic fringe pattern analysis techniques is presented. The results of searching for the optimum calculation algorithm are described. Extensive numerical simulations are compared with laboratory findings obtained when testing vibrating silicon microelements under various experimental conditions.

© 2007 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(120.7280) Instrumentation, measurement, and metrology : Vibration analysis

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 22, 2007
Manuscript Accepted: March 26, 2007
Published: July 6, 2007

Citation
Adam Styk and Krzysztof Patorski, "Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination," Appl. Opt. 46, 4613-4624 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-21-4613

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited