OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 21 — Jul. 20, 2007
  • pp: 4660–4666

Direct calculation of the optical constants for a thin film using a midpoint envelope

Stephen Humphrey  »View Author Affiliations


Applied Optics, Vol. 46, Issue 21, pp. 4660-4666 (2007)
http://dx.doi.org/10.1364/AO.46.004660


View Full Text Article

Enhanced HTML    Acrobat PDF (311 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

An algebraic method to calculate the optical constants for a weakly absorbing thin film from the spectrum of normal reflectance is described. The calculation of the refractive index of the thin film is simplified by constructing a midpoint envelope through the reflection spectrum. If a portion of the spectrum includes a region where the film is nonabsorbing, the results can be used to calculate an algebraic solution for the refractive index and the absorption coefficient of the thin film throughout the entire spectrum. The method is used to determine the constants for a coating of alumina on a glass substrate. The results are compared to the calculation from the extrema of the spectrum.

© 2007 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(240.0310) Optics at surfaces : Thin films

ToC Category:
Optics at Surfaces

History
Original Manuscript: November 30, 2006
Revised Manuscript: February 21, 2007
Manuscript Accepted: April 16, 2007
Published: July 6, 2007

Citation
Stephen Humphrey, "Direct calculation of the optical constants for a thin film using a midpoint envelope," Appl. Opt. 46, 4660-4666 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-21-4660


Sort:  Year  |  Journal  |  Reset  

References

  1. C. K. Carniglia, "Effects of dispersion on the determination of optical constants of thin films," in Thin Film Technologies II, J. Roland Jacobsson, ed., Proc. SPIE 652, 158-165 (1986).
  2. J. C. Manifacier, J. Gasiot, and J. P. Fillard, "A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film," J. Phys. E 9, 1002-1004 (1979). [CrossRef]
  3. D. E. Morton, "Characterizing optical thin films (I)," Vacuum Technol. Coat. 2(9), 24-31 (2001).
  4. H. G. Tompkins and W. A. McGahan, "The anatomy of a reflectance spectrum," in Spectroscopic Ellipsometry and Reflectometry: A User's Guide (Wiley, 1999), pp. 54-61.
  5. R. Swanepoel, "Determining refractive index and thickness of thin films from wavelength measurements only," J. Opt. Soc. Am. A 2, 1339-1343 (1985). [CrossRef]
  6. R. and G. A. J. Amaratunga, "Determination of the optical constants and thickness of thin films on slightly absorbing substrates," Appl. Opt. 34, 7914-7924 (1995).
  7. D. A. Minkov, "Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum," J. Phys. D 22, 1157-1161 (1989). [CrossRef]
  8. D. P. Arndt, R. M. A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. Tuttle Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, M. K. Purvis, D. M. Quinn, D. H. Strome, R. Swenson, P. A. Temple, and T. F. Thonn, "Multiple determination of the optical constants of thin film coating materials," Appl. Opt. 23, 3571-3596 (1984). [CrossRef] [PubMed]
  9. W. E. Case, "Algebraic method for extracting thin film optical parameters from spectrophotometer measurements," Appl. Opt. 22, 1832-1836 (1983). [CrossRef] [PubMed]
  10. V. Panayotov and I. Konstantinov, "Determination of thin film optical parameters from photometric measurements: an algebraic solution for the (T, Rf, Rb) method," Appl. Opt. 30, 2795-2800 (1991). [CrossRef] [PubMed]
  11. O. Stenzel, V. Hopfe, and P. Klobes, "Determination of optical parameters for amorphous thin film materials on semitransparent substrates from transmittance and reflectance measurements," J. Phys. D 24, 2088-2094 (1991). [CrossRef]
  12. M. Ylilammi and T. Ranta-aho, "Optical determination of the film thicknesses in multilayer thin film structures," Thin Solid Films 232, 56-62 (1993). [CrossRef]
  13. H. Anders, "An introduction to the theory of thin films," Thin Films in Optics (Focal Press, 1967), pp. 13-40.
  14. S. D. Conte and C. de Boor, "Interpolation by Polynomials," Elementary Numerical Analysis: An Algorithmic Approach (McGraw-Hill, 1980), pp. 31-71.
  15. Y. Hishikawa, N. Nakamura, S. Tsuda, S. Nakano, Y. Kishi, and Y. Kuwano, "Interference-free determination of the optical absorption coefficient and the optical gap of amorphous silicon thin films," Jpn. J. Appl. Phys. 30, 1008-1014 (1991). [CrossRef]
  16. A. Starke, H. Schink, J. Kolbe, and J. Ebert, "Laser induced damage thresholds and optical constants of ion plated and ion beam sputtered Al2O3− and HfO2− coatings for the ultraviolet," Proc. SPIE 1270, 299-304 (1990). [CrossRef]
  17. S. S. Ballard, J. S. Browder, and J. F. Ebersole, "Refractive index of special crystals and certain glasses: sapphire," in American Institute of Physics Handbook, D. E. Gray, ed. (McGraw-Hill, 1972), pp. 6-40.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited