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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 21 — Jul. 20, 2007
  • pp: 4674–4679

Fast line-shape correction procedure for imaging Fourier-transform spectrometers

Simon A. Roy, Simon Potvin, Jérôme Genest, and Raphaël Desbiens  »View Author Affiliations

Applied Optics, Vol. 46, Issue 21, pp. 4674-4679 (2007)

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An instrument line-shape correction method adapted to imaging Fourier- transform spectrometers is demonstrated. The method calibrates all pixels on the same spectral grid and permits a direct comparison of the spectral features between pixels such as emission or absorption lines. Computation speed is gained by using matrix line-shape integration formalism rather than properly inverting the line shape of each pixel. A monochromatic source is used to characterize the spectral shift of each pixel, and a line-shape correction scheme is then applied on measured interferograms. This work is motivated by the emergence of affordable infrared CCD cameras that are currently being integrated in imaging Fourier-transform spectrometers.

© 2007 Optical Society of America

OCIS Codes
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:

Original Manuscript: December 18, 2006
Revised Manuscript: March 20, 2007
Manuscript Accepted: March 28, 2007
Published: July 6, 2007

Simon A. Roy, Simon Potvin, Jérôme Genest, and Raphaël Desbiens, "Fast line-shape correction procedure for imaging Fourier-transform spectrometers," Appl. Opt. 46, 4674-4679 (2007)

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