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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 21 — Jul. 20, 2007
  • pp: 4793–4803

Second-harmonic-generation-polarimeter calibration by means of a quartz plate

Paul Lemaillet, Sylvain Rivet, Fabrice Pellen, Bernard Le Jeune, and Jack Cariou  »View Author Affiliations

Applied Optics, Vol. 46, Issue 21, pp. 4793-4803 (2007)

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A dual-rotating-retarder polarimeter was used to determine the six measurable observables of the first hyperpolarizability tensor. Calibration of such an instrument requires a reference sample dedicated to wavelength conversion. We calibrated our experimental setup by using a quartz-plate sample in a two step procedure: at first the first retarder then the second one. The retardance and ellipticity angle of both retarders were estimated by minimizing a χ2 function. We estimated the standard deviation of each parameter from noise spreading and performed this calibration procedure for two experimental case studies, i.e., two angular positions of the quartz sample.

© 2007 Optical Society of America

OCIS Codes
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(160.4330) Materials : Nonlinear optical materials
(190.0190) Nonlinear optics : Nonlinear optics
(230.5440) Optical devices : Polarization-selective devices

ToC Category:
Nonlinear Optics

Original Manuscript: January 25, 2007
Revised Manuscript: March 22, 2007
Manuscript Accepted: March 23, 2007
Published: July 6, 2007

Paul Lemaillet, Sylvain Rivet, Fabrice Pellen, Bernard Le Jeune, and Jack Cariou, "Second-harmonic-generation-polarimeter calibration by means of a quartz plate," Appl. Opt. 46, 4793-4803 (2007)

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