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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 22 — Aug. 1, 2007
  • pp: 5038–5043

Efficient reconstruction of spatially limited phase distributions from their sheared representation

Claas Falldorf, Yvonne Heimbach, Christoph von Kopylow, and Werner Jüptner  »View Author Affiliations


Applied Optics, Vol. 46, Issue 22, pp. 5038-5043 (2007)
http://dx.doi.org/10.1364/AO.46.005038


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Abstract

We present a method that allows the reconstruction of smooth phase distributions from their laterally sheared representation. The proposed approach is efficient in the sense that only one sheared distribution is needed to completely restore the signal. A mandatory requirement is that the phase distribution is spatially limited. The method is exemplified by means of a synthetic signal, and in addition a practical algorithm is given. Finally, experimental results are presented. The deformation of a metallic surface is investigated by both speckle shearography and electronic speckle pattern interferometry (ESPI) respectively. To give proof of the proposed technique, the phase distribution reconstructed from the shearographic measurement is shown to match the results obtained by the ESPI.

© 2007 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(100.3010) Image processing : Image reconstruction techniques
(100.5070) Image processing : Phase retrieval
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4630) Instrumentation, measurement, and metrology : Optical inspection

ToC Category:
Image Processing

History
Original Manuscript: January 24, 2007
Revised Manuscript: April 25, 2007
Manuscript Accepted: April 25, 2007
Published: July 6, 2007

Citation
Claas Falldorf, Yvonne Heimbach, Christoph von Kopylow, and Werner Jüptner, "Efficient reconstruction of spatially limited phase distributions from their sheared representation," Appl. Opt. 46, 5038-5043 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-22-5038

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