Gaussian profile estimation in one dimension
Applied Optics, Vol. 46, Issue 22, pp. 5374-5383 (2007)
http://dx.doi.org/10.1364/AO.46.005374
Enhanced HTML 
Acrobat PDF (687 KB)
Abstract
We present several new results on the classic problem of estimating Gaussian profile parameters from a set of noisy data, showing that an exact solution of the maximum likelihood equations exists for additive Gaussian-distributed noise. Using the exact solution makes it possible to obtain analytic formulas for the variances of the estimated parameters. Finally, we show that the classic formulation of the problem is actually biased, but that the bias can be eliminated by a straightforward algorithm.
© 2007 Optical Society of America
OCIS Codes
(030.6600) Coherence and statistical optics : Statistical optics
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5240) Instrumentation, measurement, and metrology : Photometry
(300.3700) Spectroscopy : Linewidth
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: February 23, 2007
Revised Manuscript: May 10, 2007
Manuscript Accepted: May 11, 2007
Published: July 23, 2007
Citation
Nathan Hagen, Matthew Kupinski, and Eustace L. Dereniak, "Gaussian profile estimation in one dimension," Appl. Opt. 46, 5374-5383 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-22-5374
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Wavelength standard at 543 nm and the corresponding 127I2 hyperfine transitions (JOSAB)
- Precision measurement of wavelengths emitted by a molecular fluorine laser at 157 nm (AO)
- Sub-Doppler molecular-iodine transitions near the dissociation limit (523–498 nm) (OL)
- Sub-Doppler molecular-iodine transitions near the dissociation limit (523–498 nm): errata (OL)
- Modeling the Bidirectional Reflectance of Emissive Displays (AO)
Related Conference Papers
- Noise properties of phase-coherent supercontinua
- Frequency response metrology for high-speed optical receivers
- Ti:Sapphire Lasers for Frequency Metrology Spanning the Visible and Infrared Spectrum without Nonlinear Fiber
- Ultra-sensitive ambient trace-gas sensor using CO2 lasers and photoacoustic spectroscopy
- Agricultural ammonia sensor using diode lasers and photoacoustic spectroscopy
« Previous Article | Next Article »
OSA is a member of 