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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 23 — Aug. 10, 2007
  • pp: 5598–5603

Scalar diffraction modeling in optical disk recording using wave function assembling

Bin Yin, Wim M. J. Coene, and Andries P. Hekstra  »View Author Affiliations


Applied Optics, Vol. 46, Issue 23, pp. 5598-5603 (2007)
http://dx.doi.org/10.1364/AO.46.005598


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Abstract

A new scalar diffraction modeling method for simulating the readout signal of optical disks is described. The information layer is discretized into pixels that are grouped in specific ways to form written and unwritten areas. A set of 2D wave functions resulting from these pixels at the detection aperture is established. A readout signal is obtained via the assembly of wave functions from this set according to the content under the scanning spot. The method allows efficient simulation of jitter noise due to edge deformation of recorded marks, which is important at high densities. It is also capable of simulating a physically irregular mark, thereby helping to understand and optimize the recording process.

© 2007 Optical Society of America

OCIS Codes
(210.0210) Optical data storage : Optical data storage
(210.4590) Optical data storage : Optical disks
(260.1960) Physical optics : Diffraction theory

ToC Category:
Optical Data Storage

History
Original Manuscript: December 8, 2006
Manuscript Accepted: February 18, 2007
Published: August 7, 2007

Citation
Bin Yin, Wim M. J. Coene, and Andries P. Hekstra, "Scalar diffraction modeling in optical disk recording using wave function assembling," Appl. Opt. 46, 5598-5603 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-23-5598

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