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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 23 — Aug. 10, 2007
  • pp: 5680–5686

Simultaneous measurement of out-of-plane displacement and slope using a multiaperture DSPI system and fast Fourier transform

Basanta Bhaduri, Nandigana Krishna Mohan, and Mahendra Prasad Kothiyal  »View Author Affiliations


Applied Optics, Vol. 46, Issue 23, pp. 5680-5686 (2007)
http://dx.doi.org/10.1364/AO.46.005680


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Abstract

The simultaneous quantitative measurement of out-of-plane displacement and slope using the fast Fourier transform method with a single three-aperture digital speckle pattern interferometry (DSPI) arrangement is demonstrated. The method coherently combines two sheared object waves with a smooth reference wave at the CCD placed at the image plane of an imaging lens with a three-aperture mask placed in front of it. The apertures also introduce multiple spatial carrier fringes within the speckle. A fast Fourier transform of the image generates seven distinct diffraction halos in the spectrum. By selecting the appropriate halos, one can directly obtain two independent out-of-plane displacement phase maps and a slope phase map from the two speckle images, one before and the second after loading the object. It is also demonstrated that by subtracting the out-of-plane displacement phase maps one can generate the same slope phase map. Experimental results are presented for a circular diaphragm clamped along the edges and loaded at the center.

© 2007 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 16, 2007
Revised Manuscript: May 14, 2007
Manuscript Accepted: May 14, 2007
Published: August 8, 2007

Citation
Basanta Bhaduri, Nandigana Krishna Mohan, and Mahendra Prasad Kothiyal, "Simultaneous measurement of out-of-plane displacement and slope using a multiaperture DSPI system and fast Fourier transform," Appl. Opt. 46, 5680-5686 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-23-5680

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