Corrections to facilitate planar imaging of particle concentration in particle-laden flows using Mie scattering, Part 1: Collimated laser sheets
Applied Optics, Vol. 46, Issue 23, pp. 5823-5834 (2007)
http://dx.doi.org/10.1364/AO.46.005823
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Abstract
Planar nephelometry is a laser-based technique of imaging the light scattered from particles to provide information about the local number density of these particles. In many seeded flows of practical interest, such as pulverized coal flames, particle loadings are sufficiently high for the incident laser beam to be severely attenuated. Measurements in these flows are therefore difficult, and limited data are available under these conditions. Laser attenuation experiments were conducted in suspensions of spherical particles in water at various concentrations. This is used to formulate a calibration for the effects of diffuse scattering and laser sheet extinction. A model for the distribution of light through a heavily seeded, light-scattering medium is also developed and is compared with experimental results. It is demonstrated that the scattered signal may be considered proportional to the local particle concentration multiplied by the incident laser power. The incident laser power varies as a function of the attenuation by obscurement. This correction for planar nephelometry images thus extends the technique to provide pseudoquantitative data for instantaneous particle concentration measurements.
© 2007 Optical Society of America
OCIS Codes
(100.2000) Image processing : Digital image processing
(110.2970) Imaging systems : Image detection systems
(290.5850) Scattering : Scattering, particles
ToC Category:
Scattering
History
Original Manuscript: February 23, 2007
Revised Manuscript: June 7, 2007
Manuscript Accepted: June 11, 2007
Published: August 9, 2007
Citation
Peter A. M. Kalt, Cristian H. Birzer, and Graham J. Nathan, "Corrections to facilitate planar imaging of particle concentration in particle-laden flows using Mie scattering, Part 1: Collimated laser sheets," Appl. Opt. 46, 5823-5834 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-23-5823
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