White-light interferometry using a channeled spectrum. I. General models and fringe estimation algorithms
Applied Optics, Vol. 46, Issue 23, pp. 5853-5865 (2007)
http://dx.doi.org/10.1364/AO.46.005853
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Abstract
Astrometric measurements using stellar interferometry rely on the precise measurement of the central white-light fringe to accurately obtain the optical path-length difference of incoming starlight to the two arms of the interferometer. Because of dispersion in the optical system the optical path-length difference is a function of the wavelength of the light and extracting the proper astrometric signatures requires accommodating these effects. One standard approach to stellar interferometry uses a channeled spectrum to determine phases at a number of different wavelengths that are then converted to the path-length delay. Because of throughput considerations these channels are made sufficiently broad so that monochromatic models are inadequate for retrieving the phase∕delay information. The presence of dispersion makes the polychromatic modeling problem for phase estimation even more difficult because of its effect on the complex visibility function. We introduce a class of models that rely on just a few spectral and dispersion parameters. A phase-shifting interferometry algorithm is derived that exploits the model structure. Numerical examples are given to illustrate the robustness and precision of the approach.
© 2007 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
ToC Category:
Interferometry
History
Original Manuscript: March 9, 2007
Revised Manuscript: May 31, 2007
Manuscript Accepted: June 5, 2007
Published: August 9, 2007
Citation
Mark H. Milman, Chengxing Zhai, and Martin Regehr, "White-light interferometry using a channeled spectrum. I. General models and fringe estimation algorithms," Appl. Opt. 46, 5853-5865 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-23-5853
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