Estimation of the phase error in interferometric measurements by evaluation of the speckle field intensity
Applied Optics, Vol. 46, Issue 24, pp. 6096-6104 (2007)
http://dx.doi.org/10.1364/AO.46.006096
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Abstract
Intensities recorded with CCD or CMOS sensors represent spatially averaged values of the intensity across the area of a pixel. In this work we investigate the influence of spatial averaging in interferograms on the evaluated phase from an object wave with well resolved, fully developed speckles. Based on an analytical description of the averaging process, a procedure is developed to create a quality map for the evaluated phase, in order to give an estimation of the expected error at each point. The proposed method uses only the local intensity distribution of the object wave for the qualification of the phase values. The theoretical results are tested and verified by means of numerically generated objective and subjective speckle fields.
© 2007 Optical Society of America
OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(100.5070) Image processing : Phase retrieval
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
ToC Category:
Interferometry
History
Original Manuscript: March 26, 2007
Revised Manuscript: June 4, 2007
Manuscript Accepted: June 15, 2007
Published: August 14, 2007
Citation
Ervin Kolenović and Wolfgang Osten, "Estimation of the phase error in interferometric measurements by evaluation of the speckle field intensity," Appl. Opt. 46, 6096-6104 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-24-6096
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