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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 24 — Aug. 20, 2007
  • pp: 6113–6119

Uneven fringe projection for efficient calibration in high-resolution 3D shape metrology

Zonghua Zhang, Catherine E. Towers, and David P. Towers  »View Author Affiliations


Applied Optics, Vol. 46, Issue 24, pp. 6113-6119 (2007)
http://dx.doi.org/10.1364/AO.46.006113


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Abstract

A novel uneven fringe projection technique is presented whereby nonuniformly spaced fringes are generated at a digital video projector to give evenly spaced fringes in the measurement volume. The proposed technique simplifies the relation between the measured phase and the object's depth independent of pixel position. This method needs just one coefficient set for calibration and depth calculation. With uneven fringe projection the shape data are referenced to a virtual plane instead of a physical reference plane, so an improved measurement with lower uncertainty is achieved. Further, the method can be combined with a radial lens distortion model. The theoretical foundation of the method is presented and experimentally validated to demonstrate the advantages of the uneven fringe projection approach compared with existing methods. Measurement results on a National Physical Laboratory (UK) “step standard” confirm the measurement uncertainty using the proposed method.

© 2007 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 17, 2007
Manuscript Accepted: May 15, 2007
Published: August 14, 2007

Citation
Zonghua Zhang, Catherine E. Towers, and David P. Towers, "Uneven fringe projection for efficient calibration in high-resolution 3D shape metrology," Appl. Opt. 46, 6113-6119 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-24-6113

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