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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 24 — Aug. 20, 2007
  • pp: 6161–6165

Millimeter- and submillimeter-wave characterization of various fabrics

Ilya Dunayevskiy, Bartosz Bortnik, Kevin Geary, Russell Lombardo, Michael Jack, and Harold Fetterman  »View Author Affiliations


Applied Optics, Vol. 46, Issue 24, pp. 6161-6165 (2007)
http://dx.doi.org/10.1364/AO.46.006161


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Abstract

Transmission measurements of 14 fabrics are presented in the millimeter-wave and submillimeter-wave electromagnetic regions from 130   GHz to 1.2   THz . Three independent sources and experimental setups were used to obtain accurate results over a wide spectral range. Reflectivity, a useful parameter for imaging applications, was also measured for a subset of samples in the submillimeter-wave regime along with polarization sensitivity of the transmitted beam and transmission through doubled layers. All of the measurements were performed in free space. Details of these experimental setups along with their respective challenges are presented.

© 2007 Optical Society of America

OCIS Codes
(260.3090) Physical optics : Infrared, far
(300.6270) Spectroscopy : Spectroscopy, far infrared

ToC Category:
Spectroscopy

History
Original Manuscript: February 8, 2007
Revised Manuscript: June 6, 2007
Manuscript Accepted: June 15, 2007
Published: August 16, 2007

Citation
Ilya Dunayevskiy, Bartosz Bortnik, Kevin Geary, Russell Lombardo, Michael Jack, and Harold Fetterman, "Millimeter- and submillimeter-wave characterization of various fabrics," Appl. Opt. 46, 6161-6165 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-24-6161

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