OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 25 — Sep. 1, 2007
  • pp: 6247–6250

Phase shift and penetration depth of metal mirrors in a microcavity structure

Fengying Ma and Xingyuan Liu  »View Author Affiliations


Applied Optics, Vol. 46, Issue 25, pp. 6247-6250 (2007)
http://dx.doi.org/10.1364/AO.46.006247


View Full Text Article

Enhanced HTML    Acrobat PDF (529 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Optical properties of metal films, such as phase shift on reflection or penetration depth of electromagnetic waves into mirrors, play an important role in determining the resonance wavelength of a microcavity. We created a series of λ / 2 cavities with a symmetrical structure of glass∕Ag∕lithium fluoride∕Ag by changing the thickness of the Ag film. The penetration depth at different thicknesses of Ag film was obtained from the transmittance peaks of the cavities. Phase shift on reflection at the lithium fluoride–Ag interface was calculated based on the measured optical constants. The formulation between phase shift and penetration depth was proved by experimental results, which are in good agreement with the theoretical calculations.

© 2007 Optical Society of America

OCIS Codes
(230.4040) Optical devices : Mirrors
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Optical Devices

History
Original Manuscript: March 8, 2007
Revised Manuscript: June 30, 2007
Manuscript Accepted: July 1, 2007
Published: August 22, 2007

Citation
Fengying Ma and Xingyuan Liu, "Phase shift and penetration depth of metal mirrors in a microcavity structure," Appl. Opt. 46, 6247-6250 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-25-6247


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. H. Yokoyama, "Physics and device applications of optical microcavities," Science 256, 66-70 (1992). [CrossRef] [PubMed]
  2. F. De Martini, M. Marrocco, P. Mataloni, L. Crescentini, and R. Loudon, "Spontaneous emission in the optical microscopic cavity," Phys. Rev. A 43, 2480-2497 (1991). [CrossRef] [PubMed]
  3. A. Billeb, W. Grieshaber, D. Stocker, E. F. Schubert, and R. F. Karlicek, Jr., "Microcavity effects in GaN epitaxial films and in Ag/GaN/sapphire structures," Appl. Phys. Lett. 70, 2790-2792 (1997). [CrossRef]
  4. H. Benisty, H. De Neve, and C. Weisbuch, "Impact of planar microcavity effects on light extraction-Part I. Basic concepts and analytical trends," IEEE J. Quantum Electron. 34, 1612-1631 (1998). [CrossRef]
  5. M. S. Ünlü and S. Strite, "Resonant cavity enhanced photonic devices," J. Appl. Phys. 78, 607-639 (1995). [CrossRef]
  6. R. S. Geels, S. W. Corzine, and L. A. Coldren, "InGaAs vertical-cavity surface-emitting lasers," IEEE J. Quantum Electron. 27, 1359-1367 (1991). [CrossRef]
  7. T. Virgili, D. G. Lidzey, M. Grell, D. D. C. Bradley, S. Stagira, M. Zavelani-Rossi, and S. De Silvestri, "Influence of the orientation of liquid crystalline poly(9,9-dioctylfluorene) on its lasing properties in a planar microcavity," Appl. Phys. Lett. 80, 4088-4090 (2002). [CrossRef]
  8. J. Grüner, F. Cacialli, and R. H. Friend, "Emission enhancement in single-layer conjugated polymer microcavities," J. Appl. Phys. 80, 207-215 (1996). [CrossRef]
  9. Z. Deng, Y. Zhan, H. Duan, Z. Xiong, F. Bai, and Y. Wang, "Optical microcavity based on porous and organic materials," Synth. Met. 129, 299-302 (2002). [CrossRef]
  10. A. Dodabalapur, L. J. Rothberg, R. H. Jordan, T. M. Miller, R. E. Slusher, and J. M. Phillips, "Physics and applications of organic microcavity light emitting diodes," J. Appl. Phys. 80, 6954-6964 (1996). [CrossRef]
  11. S. Tokito, T. Tsutsui, and Y. Taga, "Microcavity organic light-emitting diodes for strongly directed pure red, green, and blue emissions," J. Appl. Phys. 86, 2407-2411 (1999). [CrossRef]
  12. W. Lichten, "Precise wavelength measurements and optical phase shifts. I. General theory," J. Opt. Soc. Am. A 2, 1869-1876 (1985). [CrossRef]
  13. B. Temelkuran, E. Ozbay, M. M. Sigalas, G. Tuttle, C. M. Soukoulis, and K. M. Ho, "Reflection properties of metallic photonic crystals," Appl. Phys. A 66, 363-365 (1998). [CrossRef]
  14. J. M. Bennett, "Precise method for measuring the absolute phase change on reflection," J. Opt. Soc. Am 54, 612-624 (1964). [CrossRef]
  15. W. H. Briscoe and R. G. Horn, "Optical phase change at the interface between mica and thin silver film," J. Opt. A 6, 112-116 (2004). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2 Fig. 3
 
Fig. 4 Fig. 5
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited