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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 25 — Sep. 1, 2007
  • pp: 6469–6475

Phase unwrapping method for three-dimensional stress analysis by scattered-light photoelasticity with unpolarized light. 2. Experiment

Toshiki Kihara  »View Author Affiliations

Applied Optics, Vol. 46, Issue 25, pp. 6469-6475 (2007)

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A phase unwrapping method that employs scattered-light photoelasticity with unpolarized light was proposed for automated three-dimensional stress analysis [Appl. Opt. 45, 8848 (2006)]. I now demonstrate the validity of this method by performing nondestructive measurements at three different wavelengths of the secondary principal stress direction ψ j and the total relative phase retardation ρ j t o t in the plane that contains the rotated principal stress directions in a spherical frozen stress model and compare the results obtained with mechanically sliced models. The parameters ψ j and ρ j t o t were measured nondestructively over the entire field of view for the first time, to the best of my knowledge.

© 2007 Optical Society of America

OCIS Codes
(100.3190) Image processing : Inverse problems
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: March 16, 2007
Revised Manuscript: June 15, 2007
Manuscript Accepted: June 23, 2007
Published: August 31, 2007

Toshiki Kihara, "Phase unwrapping method for three-dimensional stress analysis by scattered-light photoelasticity with unpolarized light. 2. Experiment," Appl. Opt. 46, 6469-6475 (2007)

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