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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 25 — Sep. 1, 2007
  • pp: 6476–6482

Induced-dipole-electric-field contribution of atomic chains and atomic planes to the refractive index and birefringence of nanoscale crystalline dielectrics

Thomas K. Gaylord and Yin-Jung Chang  »View Author Affiliations


Applied Optics, Vol. 46, Issue 25, pp. 6476-6482 (2007)
http://dx.doi.org/10.1364/AO.46.006476


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Abstract

The induced-dipole-electric-field contribution to the refractive index at any location within a nanometer-scale dielectric is quantified by summing the electronic dipole contributions due to all the surrounding atoms in the dielectric. Using a tetragonal lattice and varying the ratio of lattice constants illustrates the important limiting chainlike and planelike behaviors. Strong polarizing effects and thus high refractive indices occur for an electric field applied along the length of a chain of atoms or applied in a planar direction to a plane of atoms. In contrast, a strong depolarizing effect and thus low refractive indices occur for an electric field applied normal to a chain of atoms or applied normal to a plane of atoms. Birefringence is increased or decreased by the simultaneous presence or absence of polarizing and depolarizing effects.

© 2007 Optical Society of America

OCIS Codes
(160.1190) Materials : Anisotropic optical materials
(160.3130) Materials : Integrated optics materials
(160.4760) Materials : Optical properties

ToC Category:
Materials

History
Original Manuscript: March 16, 2007
Revised Manuscript: May 4, 2007
Manuscript Accepted: May 11, 2007
Published: August 31, 2007

Citation
Thomas K. Gaylord and Yin-Jung Chang, "Induced-dipole-electric-field contribution of atomic chains and atomic planes to the refractive index and birefringence of nanoscale crystalline dielectrics," Appl. Opt. 46, 6476-6482 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-25-6476

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