Referenceless segmentation of flaws in woven fabrics
Applied Optics, Vol. 46, Issue 27, pp. 6688-6699 (2007)
http://dx.doi.org/10.1364/AO.46.006688
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Abstract
The automatic segmentation of flaws in woven fabrics is achieved by applying Fourier analysis to the image of the sample under inspection, without considering any reference image. No prior information about the fabric structure or the defect is required. The algorithm is based on the structural feature extraction of the weave repeat from the Fourier transform of the sample image. These features are used to define a set of multiresolution bandpass filters, adapted to the fabric structure, that operate in the Fourier domain. Inverse Fourier transformation, binarization, and merging of the information obtained at different scales lead to the output image that contains flaws segmented from the fabric background. The whole process is fully automatic and can be implemented either optically or electronically. Experimental results are presented and discussed for a variety of fabrics and defects.
© 2007 Optical Society of America
OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(070.5010) Fourier optics and signal processing : Pattern recognition
(070.6110) Fourier optics and signal processing : Spatial filtering
(100.2960) Image processing : Image analysis
(150.3040) Machine vision : Industrial inspection
ToC Category:
Fourier Optics and Signal Processing
History
Original Manuscript: March 8, 2007
Revised Manuscript: May 11, 2007
Manuscript Accepted: May 22, 2007
Published: September 11, 2007
Citation
Miquel Ralló, María S. Millán, and Jaume Escofet, "Referenceless segmentation of flaws in woven fabrics," Appl. Opt. 46, 6688-6699 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-27-6688
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