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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 28 — Oct. 1, 2007
  • pp: 7026–7034

Study of the surface structure of butterfly wings using the scanning electron microscopic moiré method

Satoshi Kishimoto, Qinghua Wang, Huimin Xie, and Yapu Zhao  »View Author Affiliations


Applied Optics, Vol. 46, Issue 28, pp. 7026-7034 (2007)
http://dx.doi.org/10.1364/AO.46.007026


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Abstract

Scanning electron microscopic (SEM) moiré method was used to study the surface structure of three kinds of butterfly wings: Papilio maackii Menetries, Euploea midamus (Linnaeus), and Stichophthalma howqua (Westwood). Gratings composed of curves with different orientations were found on scales. The planar characteristics of gratings and some other planar features of the surface structure of these wings were revealed, respectively, in terms of virtual strain. Experimental results demonstrate that SEM moiré method is a simple, nonlocal, economical, effective technique for determining which grating exists on one whole scale, measuring the dimension and the whole planar structural character of the grating on each scale, as well as characterizing the relationship between gratings on different scales of each butterfly wing. Thus, the SEM moiré method is a useful tool to assist with characterizing the structure of butterfly wings and explaining their excellent properties.

© 2007 Optical Society of America

OCIS Codes
(000.1430) General : Biology and medicine
(050.2770) Diffraction and gratings : Gratings
(120.4120) Instrumentation, measurement, and metrology : Moire' techniques

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 18, 2007
Revised Manuscript: July 24, 2007
Manuscript Accepted: August 20, 2007
Published: September 27, 2007

Virtual Issues
Vol. 2, Iss. 11 Virtual Journal for Biomedical Optics

Citation
Satoshi Kishimoto, Qinghua Wang, Huimin Xie, and Yapu Zhao, "Study of the surface structure of butterfly wings using the scanning electron microscopic moiré method," Appl. Opt. 46, 7026-7034 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-28-7026


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