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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 28 — Oct. 1, 2007
  • pp: 7049–7053

Spatial effect on the interference of light propagated in a film structure

Ming-Yu Sheng, Yun-Hua Wu, Shou-Zhi Feng, Yue-Rui Chen, Yu-Xiang Zheng, and Liang-Yao Chen  »View Author Affiliations

Applied Optics, Vol. 46, Issue 28, pp. 7049-7053 (2007)

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The interference of light has been analyzed for a film structure by considering that a spatial separation exists for the two neighboring light beams to be interfered in the space. There is a significant difference between the situations of the interference with or without consideration of the spatial effect, especially around the region where the phase delay δ = π and 2π by taking the example of the one-layered SiO 2 / Si structure. It is reasonable to extract the optical parameters by neglecting the spatial effect only for the thinner film with a thickness much smaller than a wavelength, which satisfies the condition that δ < π ; otherwise, the film equation used for the periodic or nonperiodic structures will be modified by including the spatial effect in the data analysis and applications.

© 2007 Optical Society of America

OCIS Codes
(260.3160) Physical optics : Interference
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Physical Optics

Original Manuscript: June 8, 2007
Revised Manuscript: August 9, 2007
Manuscript Accepted: August 13, 2007
Published: September 27, 2007

Ming-Yu Sheng, Yun-Hua Wu, Shou-Zhi Feng, Yue-Rui Chen, Yu-Xiang Zheng, and Liang-Yao Chen, "Spatial effect on the interference of light propagated in a film structure," Appl. Opt. 46, 7049-7053 (2007)

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