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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 29 — Oct. 10, 2007
  • pp: 7172–7178

Two-step phase-shifting fringe projection profilometry: intensity derivative approach

Fujun Yang and Xiaoyuan He  »View Author Affiliations

Applied Optics, Vol. 46, Issue 29, pp. 7172-7178 (2007)

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A new two-step phase-shifting fringe projection profilometry is proposed. The slowly variable background intensity of fringe patterns is removed by the use of an intensity differential algorithm. The high-resolution differential algorithm is achieved based on global interpolation of fringe gray level on a subpixel scale. Compared with the traditional three- or four-step phase-shifting method, the profile measurement is sped up with this approach. Computer simulation and experimental performance are evaluated to demonstrate the validity of the proposed measurement method. The experimental results compared with those of the four-step phase-shifting method are presented.

© 2007 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 28, 2007
Revised Manuscript: August 23, 2007
Manuscript Accepted: August 23, 2007
Published: October 4, 2007

Fujun Yang and Xiaoyuan He, "Two-step phase-shifting fringe projection profilometry: intensity derivative approach," Appl. Opt. 46, 7172-7178 (2007)

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