Spectral reflectance and responsivity of Ge- and InGaAs-photodiodes in the near-infrared: measurement and model
Applied Optics, Vol. 46, Issue 29, pp. 7337-7344 (2007)
http://dx.doi.org/10.1364/AO.46.007337
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Abstract
The spectral reflectance and responsivity of Ge- and InGaAs-photodiodes at (nearly) normal and oblique incidence (45°) were investigated. The derived data allow a calculation of the photodiodes responsivities for any incident angle. The measurements were carried out with s-
and p-polarized radiation in the wavelength range from 1260 to
© 2007 Optical Society of America
OCIS Codes
(040.5160) Detectors : Photodetectors
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
ToC Category:
Detectors
History
Original Manuscript: June 8, 2007
Manuscript Accepted: July 31, 2007
Published: October 9, 2007
Citation
M. López, H. Hofer, K. D. Stock, J. C. Bermúdez, A. Schirmacher, F. Schneck, and S. Kück, "Spectral reflectance and responsivity of Ge- and InGaAs-photodiodes in the near-infrared: measurement and model," Appl. Opt. 46, 7337-7344 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-29-7337
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