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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 3 — Jan. 20, 2007
  • pp: 431–433

Polarizing properties of embedded symmetric trilayer stacks under conditions of frustrated total internal reflection: erratum

Rasheed M. A. Azzam and Siva R. Perla  »View Author Affiliations


Applied Optics, Vol. 46, Issue 3, pp. 431-433 (2007)
http://dx.doi.org/10.1364/AO.46.000431


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Abstract

An error in the application of the designprocedure described in a previous paper [Appl. Opt. 45, 1650 (2006)] has been corrected, and new revised figures are included in this erratum.

© 2007 Optical Society of America

OCIS Codes
(230.5440) Optical devices : Polarization-selective devices
(240.0310) Optics at surfaces : Thin films
(310.0310) Thin films : Thin films

ToC Category:
Errata

History
Original Manuscript: November 2, 2006
Published: January 4, 2007

Citation
Rasheed M. A. Azzam and Siva R. Perla, "Polarizing properties of embedded symmetric trilayer stacks under conditions of frustrated total internal reflection: erratum," Appl. Opt. 46, 431-433 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-3-431

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