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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 31 — Nov. 1, 2007
  • pp: 7776–7779

Correlation of sidelobe suppression between rugate filters and multilayer mirrors

Bicher Haj Ibrahim, Roelene Botha, Jean-Eric Bourée, Pavel Bulkin, and Bernard Drévillon  »View Author Affiliations


Applied Optics, Vol. 46, Issue 31, pp. 7776-7779 (2007)
http://dx.doi.org/10.1364/AO.46.007776


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Abstract

We present the study of the correlation between refractive index profiles and the optical response of rugate filters and multilayer mirrors. The conventionally used method in multilayer mirrors for ripple suppression in the passband will be compared with a similar simple method to remove the rugate filter sidelobes without apodization. The resulting layers are compared in performance with a typical quintic matching layer. An example based on silicon oxynitride alloys with refractive indices ranging between 1.47 and 1.83 was designed and deposited.

© 2007 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.1620) Thin films : Interference coatings

ToC Category:
Thin Films

History
Original Manuscript: April 16, 2007
Revised Manuscript: June 29, 2007
Manuscript Accepted: October 2, 2007
Published: October 31, 2007

Citation
Bicher Haj Ibrahim, Roelene Botha, Jean-Eric Bourée, Pavel Bulkin, and Bernard Drévillon, "Correlation of sidelobe suppression between rugate filters and multilayer mirrors," Appl. Opt. 46, 7776-7779 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-31-7776

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