OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 32 — Nov. 10, 2007
  • pp: 7797–7804

Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation

Alexander Gottwald, Françoise Bridou, Mireille Cuniot-Ponsard, Jean-Michel Desvignes, Simone Kroth, Udo Kroth, Wolfgang Paustian, Mathias Richter, Hendrik Schöppe, and Reiner Thornagel  »View Author Affiliations


Applied Optics, Vol. 46, Issue 32, pp. 7797-7804 (2007)
http://dx.doi.org/10.1364/AO.46.007797


View Full Text Article

Acrobat PDF (1920 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

In the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the Berlin electron-storage ring BESSY II, a procedure has been developed to investigate the dependence of vacuum-ultraviolet reflection on polarization. It is based on characterizing the elliptically polarized synchrotron radiation at PTB's normal-incidence monochromator beamline for reflectometry by means of polarization-sensitive photodetectors. For this purpose, the polarization dependency in the detector responsivity was determined at a small, low, solid angle of acceptance for the synchrotron radiation, i.e., within the orbital plane of the storage ring where the degree of linear polarization is known to be almost 100%. Our method allows the polarization dependence of reflection samples to be measured with relative standard uncertainties ranging from 2.4% to 11% in the spectral range between 60 and 160 nm. The method has been applied to the optimization of polarizing mirrors at the Lyman-α wavelength of 121.6 nm.

© 2007 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(260.7210) Physical optics : Ultraviolet, vacuum
(340.6720) X-ray optics : Synchrotron radiation

ToC Category:
Polarimetry

History
Original Manuscript: June 22, 2007
Revised Manuscript: September 19, 2007
Manuscript Accepted: September 24, 2007
Published: November 1, 2007

Citation
Alexander Gottwald, Françoise Bridou, Mireille Cuniot-Ponsard, Jean-Michel Desvignes, Simone Kroth, Udo Kroth, Wolfgang Paustian, Mathias Richter, Hendrik Schöppe, and Reiner Thornagel, "Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation," Appl. Opt. 46, 7797-7804 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-32-7797

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited