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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 32 — Nov. 10, 2007
  • pp: 7797–7804

Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation

Alexander Gottwald, Françoise Bridou, Mireille Cuniot-Ponsard, Jean-Michel Desvignes, Simone Kroth, Udo Kroth, Wolfgang Paustian, Mathias Richter, Hendrik Schöppe, and Reiner Thornagel  »View Author Affiliations


Applied Optics, Vol. 46, Issue 32, pp. 7797-7804 (2007)
http://dx.doi.org/10.1364/AO.46.007797


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Abstract

In the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the Berlin electron-storage ring BESSY II, aprocedure has been developed to investigate the dependence of vacuum-ultraviolet reflection on polarization. It is based on characterizing the elliptically polarized synchrotron radiation at PTB's normal-incidence monochromator beamline for reflectometry by means of polarization-sensitive photodetectors. For this purpose, the polarization dependency in the detector responsivity was determined at a small, low, solid angle of acceptance for the synchrotron radiation, i.e., within the orbital plane of the storage ring where the degree of linear polarization is known to be almost 100%. Our method allows the polarization dependence of reflection samples to be measured with relative standard uncertainties ranging from 2.4% to 11% in the spectral range between 60 and 160   nm . The method has been applied to the optimization of polarizing mirrors at the Lyman-α wavelength of 121.6   nm .

© 2007 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(260.7210) Physical optics : Ultraviolet, vacuum
(340.6720) X-ray optics : Synchrotron radiation

ToC Category:
Polarimetry

History
Original Manuscript: June 22, 2007
Revised Manuscript: September 19, 2007
Manuscript Accepted: September 24, 2007
Published: November 1, 2007

Citation
Alexander Gottwald, Françoise Bridou, Mireille Cuniot-Ponsard, Jean-Michel Desvignes, Simone Kroth, Udo Kroth, Wolfgang Paustian, Mathias Richter, Hendrik Schöppe, and Reiner Thornagel, "Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation," Appl. Opt. 46, 7797-7804 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-32-7797


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