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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 32 — Nov. 10, 2007
  • pp: 7884–7888

Silicon beam splitter for far-infrared and terahertz spectroscopy

Christopher C. Homes, G. Lawrence Carr, Ricardo P. S. M. Lobo, Joseph D. LaVeigne, and David B. Tanner  »View Author Affiliations


Applied Optics, Vol. 46, Issue 32, pp. 7884-7888 (2007)
http://dx.doi.org/10.1364/AO.46.007884


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Abstract

Silicon beam splitters several millimeters thick offer numerous advantages over thin freestanding dielectric beam splitters. For routine spectroscopy for which resolutions of better than 1 cm 1 are not required, a silicon beam splitter can replace several Mylar beam splitters to span the entire far-infrared region. In addition to superior long-wavelength performance that extends well into the terahertz region, the silicon beam splitter has the additional advantage that its efficiency displays little polarization dependence.

© 2007 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(300.6340) Spectroscopy : Spectroscopy, infrared

ToC Category:
Spectroscopy

History
Original Manuscript: June 22, 2007
Manuscript Accepted: September 21, 2007
Published: November 8, 2007

Citation
Christopher C. Homes, G. Lawrence Carr, Ricardo P. S. M. Lobo, Joseph D. LaVeigne, and David B. Tanner, "Silicon beam splitter for far-infrared and terahertz spectroscopy," Appl. Opt. 46, 7884-7888 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-32-7884

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