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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 33 — Nov. 20, 2007
  • pp: 8027–8038

Optical depth measurements by shadow-band radiometers and their uncertainties

Mikhail D. Alexandrov, Peter Kiedron, Joseph J. Michalsky, Gary Hodges, Connor J. Flynn, and Andrew A. Lacis  »View Author Affiliations

Applied Optics, Vol. 46, Issue 33, pp. 8027-8038 (2007)

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Shadow-band radiometers in general, and especially the Multi-Filter Rotating Shadow-band Radiometer (MFRSR), are widely used for atmospheric optical depth measurements. The major programs running MFRSR networks in the United States include the Department of Energy Atmospheric Radiation Measurement (ARM) Program, U.S. Department of Agriculture UV-B Monitoring and Research Program, National Oceanic and Atmospheric Administration Surface Radiation (SURFRAD) Network, and NASA Solar Irradiance Research Network (SIRN). We discuss a number of technical issues specific to shadow-band radiometers and their impact on the optical depth measurements. These problems include instrument tilt and misalignment, as well as some data processing artifacts. Techniques for data evaluation and automatic detection of some of these problems are described.

© 2007 Optical Society of America

OCIS Codes
(010.1100) Atmospheric and oceanic optics : Aerosol detection
(010.1120) Atmospheric and oceanic optics : Air pollution monitoring
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5240) Instrumentation, measurement, and metrology : Photometry
(120.5630) Instrumentation, measurement, and metrology : Radiometry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: July 3, 2007
Manuscript Accepted: September 7, 2007
Published: November 15, 2007

Mikhail D. Alexandrov, Peter Kiedron, Joseph J. Michalsky, Gary Hodges, Connor J. Flynn, and Andrew A. Lacis, "Optical depth measurements by shadow-band radiometers and their uncertainties," Appl. Opt. 46, 8027-8038 (2007)

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