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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 33 — Nov. 20, 2007
  • pp: 8074–8079

Sinusoidal nonlinearity in wavelength-sweeping interferometry

Luc Perret and Pierre Pfeiffer  »View Author Affiliations


Applied Optics, Vol. 46, Issue 33, pp. 8074-8079 (2007)
http://dx.doi.org/10.1364/AO.46.008074


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Abstract

We report the influence of the nonlinearities in the wavelength-sweeping speed on the resulting interferometric signals in an absolute distance interferometer. The sweeping signal is launched in the reference and target interferometers from an external cavity laser source. The experimental results demonstrate a good resolution in spite of the presence of nonlinearities in the wavelength sweep. These nonlinearities can be modeled by a sum of sinusoids. A simulation is then implemented to analyze the influence of their parameters. It shows that a sinusoidal nonlinearity is robust enough to give a good final measurement uncertainty through a Fourier transform technique. It can be concluded that an optimal value of frequency and amplitude exists in the case of a sinusoidal nonlinearity.

© 2007 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 23, 2007
Revised Manuscript: September 19, 2007
Manuscript Accepted: October 13, 2007
Published: November 19, 2007

Citation
Luc Perret and Pierre Pfeiffer, "Sinusoidal nonlinearity in wavelength-sweeping interferometry," Appl. Opt. 46, 8074-8079 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-33-8074


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References

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