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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 5 — Feb. 10, 2007
  • pp: 680–684

Spatially dispersive displacement sensor utilizing a semiconductor gain chip

Ji-Bin Horng, Wei-Yang Chou, Seth Tsau, Jay Liao, Shih-Ming Hsu, Chih-Li Chen, Kun-Chieh Chang, and Yan-Kuin Su  »View Author Affiliations

Applied Optics, Vol. 46, Issue 5, pp. 680-684 (2007)

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We demonstrate the development of a simply equipped displacement sensor utilizing spatially dispersive confocal technology. It feeds the amplified spontaneous emission (ASE) of a laser diode to a wavelength-selective feedback structure that corresponds to the position of a measured surface. The displacement sensor has a detecting range of 4 μ m and precision of less than 2   nm , as proven by the analysis of the spectral shifts of the multipassed amplified output ASE. As compared with traditional sensors, the displacement sensor presented in our study requires fewer components and has as high precision as complex systems and a higher measurement rate due to the simpler strategy of displacement determination.

© 2007 Optical Society of America

OCIS Codes
(150.5670) Machine vision : Range finding
(180.5810) Microscopy : Scanning microscopy

ToC Category:
Machine Vision

Original Manuscript: May 25, 2006
Revised Manuscript: September 16, 2006
Manuscript Accepted: October 6, 2006
Published: January 25, 2007

Virtual Issues
Vol. 2, Iss. 3 Virtual Journal for Biomedical Optics

Ji-Bin Horng, Wei-Yang Chou, Seth Tsau, Jay Liao, Shih-Ming Hsu, Chih-Li Chen, Kun-Chieh Chang, and Yan-Kuin Su, "Spatially dispersive displacement sensor utilizing a semiconductor gain chip," Appl. Opt. 46, 680-684 (2007)

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