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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 5 — Feb. 10, 2007
  • pp: 753–761

Modeling of multilayer microholographic data storage

Zsolt Nagy, Pál Koppa, Enrico Dietz, Sven Frohmann, Susanna Orlic, and Emőke Lőrincz  »View Author Affiliations


Applied Optics, Vol. 46, Issue 5, pp. 753-761 (2007)
http://dx.doi.org/10.1364/AO.46.000753


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Abstract

We focus on the investigation of multilayer recording in microholographic data storage. We have developed a numerical model for calculating the electromagnetic scattering from thick microholographic gratings using the Born approximation and the direct volume integral. The signal-to-noise ratio and bit error rate were calculated to estimate the noise arising from interlayer and interhologram cross talk. Measurements were done to prove the validity of the model. The results of our calculations and the measurements show good agreement. We present the application of the model to the investigation of confocal filtering at the image plane and to the evaluation of positioning and wavelength tolerances.

© 2007 Optical Society of America

OCIS Codes
(090.7330) Holography : Volume gratings
(210.0210) Optical data storage : Optical data storage
(210.2860) Optical data storage : Holographic and volume memories

ToC Category:
Optical Data Storage

History
Original Manuscript: April 28, 2006
Revised Manuscript: September 18, 2006
Manuscript Accepted: September 27, 2006
Published: January 25, 2007

Citation
Zsolt Nagy, Pál Koppa, Enrico Dietz, Sven Frohmann, Susanna Orlic, and Emőke Lőrincz, "Modeling of multilayer microholographic data storage," Appl. Opt. 46, 753-761 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-5-753

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