We focus on the investigation of multilayer recording in microholographic data storage. We have developed a numerical model for calculating the electromagnetic scattering from thick microholographic gratings using the Born approximation and the direct volume integral. The signal-to-noise ratio and bit error rate were calculated to estimate the noise arising from interlayer and interhologram cross talk. Measurements were done to prove the validity of the model. The results of our calculations and the measurements show good agreement. We present the application of the model to the investigation of confocal filtering at the image plane and to the evaluation of positioning and wavelength tolerances.
© 2007 Optical Society of America
Optical Data Storage
Original Manuscript: April 28, 2006
Revised Manuscript: September 18, 2006
Manuscript Accepted: September 27, 2006
Published: January 25, 2007
Zsolt Nagy, Pál Koppa, Enrico Dietz, Sven Frohmann, Susanna Orlic, and Emőke Lőrincz, "Modeling of multilayer microholographic data storage," Appl. Opt. 46, 753-761 (2007)