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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 6 — Feb. 20, 2007
  • pp: 855–860

Tracking the emergence of defect in light emitting semiconductor diodes with two-photon excitation microscopy and spectral microthermography

Godofredo Bautista, Carlo Mar Blanca, and Caesar Saloma  »View Author Affiliations

Applied Optics, Vol. 46, Issue 6, pp. 855-860 (2007)

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We demonstrate a multifunctional optical technique for tracking the evolution of defects in live 605   nm LEDs. Photocurrent images, electroluminescence, and spectral reflectance maps are simultaneously acquired and utilized to evaluate LED performance at different injection currents. Free-carrier density profiles in the active region are constructed from photocurrent images that are generated via two-photon excitation (2PE) at 800   nm . A device defect is induced by electrical stress and ripples are observed in the density distribution by 2PE microscopy. The microscopic stress patterns are not revealed with linear excitation. We investigate the local thermal activity in the active region by measuring the spectral reflectance change with injection current. Spectral unmixing separates the electroluminescence and reflectance signals and high-resolution background-free thermal maps are derived to determine the device operational limits and possible connections between structural defect and thermal activity.

© 2007 Optical Society of America

OCIS Codes
(110.4190) Imaging systems : Multiple imaging
(110.6820) Imaging systems : Thermal imaging
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(180.0180) Microscopy : Microscopy
(190.4180) Nonlinear optics : Multiphoton processes

ToC Category:

Original Manuscript: July 19, 2006
Revised Manuscript: October 6, 2006
Manuscript Accepted: October 8, 2006
Published: February 2, 2007

Godofredo Bautista, Carlo Mar Blanca, and Caesar Saloma, "Tracking the emergence of defect in light emitting semiconductor diodes with two-photon excitation microscopy and spectral microthermography," Appl. Opt. 46, 855-860 (2007)

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