Rapid, automated measurement of layer thicknesses on steel coin blanks using laser-induced-breakdown spectroscopy depth profiling
Applied Optics, Vol. 46, Issue 6, pp. 935-942 (2007)
http://dx.doi.org/10.1364/AO.46.000935
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Abstract
Wereportapplication of a near-real-time method to determine layer thickness on electroplated coin blanks. The method was developed on a simple laser-induced-breakdown spectroscopy (LIBS) arrangement by monitoring relative emission-line intensities from key probe elements via successive laser ablation shots. This is a unique LIBS application where no other current spectroscopic method (inductively coupled plasma or x-ray fluorescence) can be applied effectively. Method development is discussed, and results with precalibrated coins are presented.
© 2007 Optical Society of America
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(140.3440) Lasers and laser optics : Laser-induced breakdown
(300.6360) Spectroscopy : Spectroscopy, laser
(350.3390) Other areas of optics : Laser materials processing
ToC Category:
Lasers and Laser Optics
History
Original Manuscript: June 27, 2006
Revised Manuscript: October 24, 2006
Manuscript Accepted: November 1, 2006
Published: February 2, 2007
Citation
George Asimellis, Aggelos Giannoudakos, and Michael Kompitsas, "Rapid, automated measurement of layer thicknesses on steel coin blanks using laser-induced-breakdown spectroscopy depth profiling," Appl. Opt. 46, 935-942 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-6-935
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