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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 6 — Feb. 20, 2007
  • pp: 935–942

Rapid, automated measurement of layer thicknesses on steel coin blanks using laser-induced-breakdown spectroscopy depth profiling

George Asimellis, Aggelos Giannoudakos, and Michael Kompitsas  »View Author Affiliations

Applied Optics, Vol. 46, Issue 6, pp. 935-942 (2007)

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Wereportapplication of a near-real-time method to determine layer thickness on electroplated coin blanks. The method was developed on a simple laser-induced-breakdown spectroscopy (LIBS) arrangement by monitoring relative emission-line intensities from key probe elements via successive laser ablation shots. This is a unique LIBS application where no other current spectroscopic method (inductively coupled plasma or x-ray fluorescence) can be applied effectively. Method development is discussed, and results with precalibrated coins are presented.

© 2007 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(140.3440) Lasers and laser optics : Laser-induced breakdown
(300.6360) Spectroscopy : Spectroscopy, laser
(350.3390) Other areas of optics : Laser materials processing

ToC Category:
Lasers and Laser Optics

Original Manuscript: June 27, 2006
Revised Manuscript: October 24, 2006
Manuscript Accepted: November 1, 2006
Published: February 2, 2007

George Asimellis, Aggelos Giannoudakos, and Michael Kompitsas, "Rapid, automated measurement of layer thicknesses on steel coin blanks using laser-induced-breakdown spectroscopy depth profiling," Appl. Opt. 46, 935-942 (2007)

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