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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 6 — Feb. 20, 2007
  • pp: 959–977

Particle formation from pulsed laser irradiation of soot aggregates studied with a scanning mobility particle sizer, a transmission electron microscope, and a scanning transmission x-ray microscope

Hope A. Michelsen, Alexei V. Tivanski, Mary K. Gilles, Laura H. van Poppel, Mark A. Dansson, and Peter R. Buseck  »View Author Affiliations


Applied Optics, Vol. 46, Issue 6, pp. 959-977 (2007)
http://dx.doi.org/10.1364/AO.46.000959


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Abstract

We investigated the physical and chemical changes induced in soot aggregates exposed to laser radiation using a scanning mobility particle sizer, a transmission electron microscope, and a scanning transmission x-ray microscope to perform near-edge x-ray absorption fine structure spectroscopy. Laser-induced nanoparticle production was observed at fluences above 0.12 J / cm 2 at 532   nm and 0.22 J / cm 2 at 1064   nm . Our results indicate that new particle formationproceeds via (1) vaporization of small carbon clusters by thermal or photolytic mechanisms, followed by homogeneous nucleation, (2) heterogeneous nucleation of vaporized carbon clusters onto material ablated from primary particles, or (3) bothprocesses.

© 2007 Optical Society of America

OCIS Codes
(120.1740) Instrumentation, measurement, and metrology : Combustion diagnostics
(180.5810) Microscopy : Scanning microscopy
(180.7460) Microscopy : X-ray microscopy
(350.3450) Other areas of optics : Laser-induced chemistry
(350.4990) Other areas of optics : Particles

ToC Category:
Laser-Induced Chemistry

History
Original Manuscript: April 26, 2006
Revised Manuscript: September 27, 2006
Manuscript Accepted: October 17, 2006
Published: February 2, 2007

Citation
Hope A. Michelsen, Alexei V. Tivanski, Mary K. Gilles, Laura H. van Poppel, Mark A. Dansson, and Peter R. Buseck, "Particle formation from pulsed laser irradiation of soot aggregates studied with a scanning mobility particle sizer, a transmission electron microscope, and a scanning transmission x-ray microscope," Appl. Opt. 46, 959-977 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-6-959


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