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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 7 — Mar. 1, 2007
  • pp: 1057–1065

Local frequency estimation for the fringe pattern with a spatial carrier: principle and applications

Hongwei Guo, Qi Yang, and Mingyi Chen  »View Author Affiliations


Applied Optics, Vol. 46, Issue 7, pp. 1057-1065 (2007)
http://dx.doi.org/10.1364/AO.46.001057


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Abstract

A local frequency estimation approach for the fringe pattern with a spatial carrier by which the 2D spatial frequencies at a certain pixel are estimated from its neighborhood is presented. The applications of this approach in the fringe pattern analyses are also introduced. First, a 2D spatial carrier phase-shifting algorithm is derived. With it the detuning errors induced by frequency mismatching are avoided, and the stronger phase deformations can be successfully coped with. Second, a novel aperture extrapolation method is developed by which the phase accuracies of the Fourier-transform method at the aperture boundaries are effectively improved.

© 2007 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(100.5070) Image processing : Phase retrieval
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

History
Original Manuscript: August 30, 2006
Manuscript Accepted: October 12, 2006
Published: February 12, 2007

Citation
Hongwei Guo, Qi Yang, and Mingyi Chen, "Local frequency estimation for the fringe pattern with a spatial carrier: principle and applications," Appl. Opt. 46, 1057-1065 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-7-1057


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References

  1. M. Takeda, H. Ina, and S. Kobayashi, "Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry," J. Opt. Soc. Am. 72, 156-160 (1982). [CrossRef]
  2. K. A. Nugent, "Interferogram analysis using an accurate fully automatic algorithm," Appl. Opt. 24, 3101-3105 (1985). [CrossRef] [PubMed]
  3. D. J. Bone, H.-A. Bachor, and R. J. Sandeman, "Fringe-pattern analysis using a 2D Fourier transform," Appl. Opt. 25, 1653-1660 (1986). [CrossRef] [PubMed]
  4. C. Roddier and F. Roddier, "Interferogram analysis using Fourier transform techniques," Appl. Opt. 26, 1668-1673 (1987). [CrossRef] [PubMed]
  5. J. H. Massig and J. Heppner, "Fringe-pattern analysis with high accuracy by use of the Fourier-transform method: theory and experimental tests," Appl. Opt. 40, 2081-2088 (2001). [CrossRef]
  6. M. Takeda and K. Mutoh, "Fourier transform profilometry for the automatic measurement of 3-D object shapes," Appl. Opt. 22, 3977-3982 (1983). [CrossRef] [PubMed]
  7. J.-F. Lin and X.-Y. Su, "Two-dimensional Fourier transform profilometry for the automatic measurement of three-dimensional object shapes," Opt. Eng. 34, 3297-3302 (1995). [CrossRef]
  8. R. J. Marks II, "Gerchberg's extrapolation algorithm in two dimensions," Appl. Opt. 20, 1816-1820 (1981).
  9. Y. Ichioka and M. Inuiya, "Direct phase detecting system," Appl. Opt. 11, 1507-1514 (1972). [CrossRef] [PubMed]
  10. K. H. Womack, "Interferometric phase measurement using spatial synchronous detection," Opt. Eng. 23, 391-395 (1984).
  11. S. Tang and Y. Y. Hung, "Fast profilometer for the automatic measurement of 3-D object shapes," Appl. Opt. 29, 3012-3018 (1990). [CrossRef] [PubMed]
  12. L. Mertz, "Real-time fringe-pattern analysis," Appl. Opt. 22, 1535-1539 (1983). [CrossRef] [PubMed]
  13. W. W. Macy, "Two-dimensional fringe-pattern analysis," Appl. Opt. 22, 3898-3901 (1983). [CrossRef] [PubMed]
  14. S. Toyooka and Y. Iwaasa, "Automatic profilometry of 3D diffuse by spatial phase detection," Appl. Opt. 25, 1630-1633 (1986). [CrossRef] [PubMed]
  15. M. Kujawinska and J. Wójciak, "Spatial-carrier phase-shifting technique of fringe pattern analysis," in Industrial Applications of Holographic and Speckle Measuring Techniques, W. P. Jueptner, ed., Proc. SPIE 1508, 61-67 (1991).
  16. D. C. Williams, N. S. Nassar, J. E. Banyard, and M. S. Virdee, "Digital phase-step interferometry: a simplified approach," Opt. Laser Technol. 23, 147-150 (1991). [CrossRef]
  17. R. Józwicki, M. Kujawinska, and L. Salbut, "New contra old wavefront measurement concepts for interferometric optical testing," Opt. Eng. 31, 422-433 (1992). [CrossRef]
  18. P. H. Chan and P. J. Bryanston-Cross, "Spatial phase stepping method of fringe-pattern analysis," Opt. Lasers Eng. 23, 343-354 (1995). [CrossRef]
  19. Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, "High precision two-dimensional spatial fringe analysis method," J. Mod. Opt. 44, 739-751 (1997). [CrossRef]
  20. M. Servin and F. J. Cuevas, "A novel technique for spatial phase-shifting interferometry," J. Mod. Opt. 42, 1853-1862 (1995). [CrossRef]
  21. P. L. Ransom and J. V. Kokal, "Interferogram analysis by a modified sinusoid fitting technique," Appl. Opt. 25, 4199-4204 (1986). [CrossRef] [PubMed]
  22. M. Pirga and M. Kujawinska, "Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns," Opt. Eng. 34, 2459-2466 (1995). [CrossRef]
  23. Q. Kemao, "Two-dimensional windowed Fourier transform for fringe pattern analysis: principles, applications, and implementations," Opt. Lasers Eng. 45, 304-317 (2007).
  24. J. Zhong and J. Weng, "Spatial carrier-fringe pattern analysis by means of wavelet transform: wavelet transform profilometry," Appl. Opt. 43, 4993-4998 (2004). [CrossRef] [PubMed]
  25. H. Guo and M. Chen, "Least-squares algorithm for phase-stepping interferometry with an unknown relative step," Appl. Opt. 44, 4854-4859 (2005). [CrossRef] [PubMed]
  26. H. Guo, M. Chen, and H. He, "A frequency encoding method for fringe projection profilometry," in Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, C. Quan, F. S. Chau, A. Asundi, B. S. Wong, and C. T. Lim, eds., Proc. SPIE 5852, 908-913 (2005). [CrossRef]
  27. J. E. Greivenkamp, "Generalized data reduction for heterodyne interferometry," Opt. Eng. 23, 350-352 (1984).
  28. P. Hariharan, B. Oreb, and T. Eiju, "Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm," Appl. Opt. 26, 2504-2506 (1987). [CrossRef] [PubMed]

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