Single-scan extraction of two-dimensional parameters of infrared focal plane arrays utilizing a Fourier-transform spectrometer
Applied Optics, Vol. 46, Issue 9, pp. 1379-1384 (2007)
http://dx.doi.org/10.1364/AO.46.001379
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Abstract
We present what is believed to be a novel experimental method to measure the technological parameters (spectral response and quantum yield) of an infrared focal plane array. This method makes original use of a Fourier transform spectrometer, which allows us to simultaneously extract the spectral performances of all pixels from one single set of measurements. The methodology used and the principle of the experimental setup are detailed. A Fourier analysis is shown to provide various optogeometrical information on the detector microstructure. A demonstrator based on the HgCdTe technology was designed, and satisfactory experimental results were obtained.
© 2007 Optical Society of America
OCIS Codes
(040.3060) Detectors : Infrared
(040.5160) Detectors : Photodetectors
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
History
Original Manuscript: September 1, 2006
Manuscript Accepted: November 2, 2006
Published: March 1, 2007
Citation
S. Rommeluère, R. Haïdar, N. Guérineau, J. Deschamps, E. De Borniol, A. Million, J. P. Chamonal, and G. Destefanis, "Single-scan extraction of two-dimensional parameters of infrared focal plane arrays utilizing a Fourier-transform spectrometer," Appl. Opt. 46, 1379-1384 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-9-1379
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