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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 46, Iss. 9 — Mar. 20, 2007
  • pp: 1379–1384

Single-scan extraction of two-dimensional parameters of infrared focal plane arrays utilizing a Fourier-transform spectrometer

S. Rommeluère, R. Haïdar, N. Guérineau, J. Deschamps, E. De Borniol, A. Million, J. P. Chamonal, and G. Destefanis  »View Author Affiliations


Applied Optics, Vol. 46, Issue 9, pp. 1379-1384 (2007)
http://dx.doi.org/10.1364/AO.46.001379


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Abstract

We present what is believed to be a novel experimental method to measure the technological parameters (spectral response and quantum yield) of an infrared focal plane array. This method makes original use of a Fourier transform spectrometer, which allows us to simultaneously extract the spectral performances of all pixels from one single set of measurements. The methodology used and the principle of the experimental setup are detailed. A Fourier analysis is shown to provide various optogeometrical information on the detector microstructure. A demonstrator based on the HgCdTe technology was designed, and satisfactory experimental results were obtained.

© 2007 Optical Society of America

OCIS Codes
(040.3060) Detectors : Infrared
(040.5160) Detectors : Photodetectors
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation

History
Original Manuscript: September 1, 2006
Manuscript Accepted: November 2, 2006
Published: March 1, 2007

Citation
S. Rommeluère, R. Haïdar, N. Guérineau, J. Deschamps, E. De Borniol, A. Million, J. P. Chamonal, and G. Destefanis, "Single-scan extraction of two-dimensional parameters of infrared focal plane arrays utilizing a Fourier-transform spectrometer," Appl. Opt. 46, 1379-1384 (2007)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-46-9-1379

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