Through numerical simulations, we point out that introduction of an ellipsometric measurement technique to an absorption-based surface-plasmon resonance (SPR) sensor enhances precision and sensitivity in measuring the imaginary part k of the complex refractive index of the sample.
By measuring a pair of ellipsometric
© 2007 Optical Society of America
Original Manuscript: May 31, 2006
Revised Manuscript: November 4, 2006
Manuscript Accepted: November 22, 2006
Published: March 1, 2007
Tetsuo Iwata and Shogo Maeda, "Simulation of an absorption-based surface-plasmon resonance sensor by means of ellipsometry," Appl. Opt. 46, 1575-1582 (2007)