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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 46, Iss. 9 — Mar. 20, 2007
  • pp: 1575–1582

Simulation of an absorption-based surface-plasmon resonance sensor by means of ellipsometry

Tetsuo Iwata and Shogo Maeda  »View Author Affiliations

Applied Optics, Vol. 46, Issue 9, pp. 1575-1582 (2007)

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Through numerical simulations, we point out that introduction of an ellipsometric measurement technique to an absorption-based surface-plasmon resonance (SPR) sensor enhances precision and sensitivity in measuring the imaginary part k of the complex refractive index of the sample. By measuring a pair of ellipsometric Δ Ψ parameters, instead of the conventional energy reflectance R p of p-polarized light in the Kretschmann optical arrangement, we can detect a small change of k that is proportional to that of the concentration of the sample, especially when k 1 . While one has difficulty in determining the value of k uniquely by the standard technique, when the thickness of Au under the prism is thin ( 20 30   nm ) , the ellipsometric technique (ET) overcomes the problem. Furthermore, the value of k and the thickness d s of the absorptive sample that is adsorbed on Au can be determined precisely. The ET based on the common-path polarization interferometer is robust against external disturbance such as mechanical vibration and intensity fluctuation of a light source. Although only the p-polarized light is responsible for the SPR phenomenon, we show that the introduction of the ET is significant for quantitative analysis.

© 2007 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(240.6680) Optics at surfaces : Surface plasmons

Original Manuscript: May 31, 2006
Revised Manuscript: November 4, 2006
Manuscript Accepted: November 22, 2006
Published: March 1, 2007

Tetsuo Iwata and Shogo Maeda, "Simulation of an absorption-based surface-plasmon resonance sensor by means of ellipsometry," Appl. Opt. 46, 1575-1582 (2007)

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