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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 1 — Jan. 1, 2008
  • pp: 1–8

Improving the quality of phase maps in phase object digital holographic interferometry by finding the right reconstruction distance

Eva-Lena Johansson, Lars Benckert, and Mikael Sjödahl  »View Author Affiliations


Applied Optics, Vol. 47, Issue 1, pp. 1-8 (2008)
http://dx.doi.org/10.1364/AO.47.000001


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Abstract

Improved quality of phase maps in pulsed digital holographic interferometry is demonstrated by finding the right reconstruction distance. The objective is to improve the optical phase information when the object under study is a phase object and when it is out of focus, leading to low contrast fringes in the phase map. A numerical refocusing is performed by introducing an ideal lens as a multiplication by a phase field in the Fourier domain, and then a region of maximum speckle correlation is found by comparing undisturbed and disturbed subimages in different refocused imaging planes. After finding the right reconstruction distance, a phase map of high visibility is constructed. By this technique a 30% reduction of the phase error for a flow of helium gas and a 50% reduction of the phase error for a weak thin lens were obtained, which resulted in a significant improvement of the visual appearance of the phase maps.

© 2008 Optical Society of America

OCIS Codes
(090.2880) Holography : Holographic interferometry
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging
(090.1995) Holography : Digital holography

ToC Category:
Interferometry

History
Original Manuscript: June 21, 2007
Revised Manuscript: October 16, 2007
Manuscript Accepted: October 27, 2007
Published: December 20, 2007

Virtual Issues
Vol. 3, Iss. 2 Virtual Journal for Biomedical Optics

Citation
Eva-Lena Johansson, Lars Benckert, and Mikael Sjödahl, "Improving the quality of phase maps in phase object digital holographic interferometry by finding the right reconstruction distance," Appl. Opt. 47, 1-8 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-1-1

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