Quantitative structured-illumination phase microscopy
Applied Optics, Vol. 47, Issue 1, pp. 15-24 (2008)
http://dx.doi.org/10.1364/AO.47.000015
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Abstract
We introduce a quantitative phase imaging method for homogeneous objects with a bright field transmission microscope by using an amplitude mask and a digitalprocessing algorithm. A known amplitude pattern is imaged on the sample plane containing a thick phase object by placing an amplitude mask in the field diaphragm of the microscope. The phase object distorts the amplitude pattern according to its optical path length (OPL) profile, and the distorted pattern is recorded in a CCD detector. A digitalprocessing algorithm then estimates the object's quantitative OPL profile based on a closed form analytical solution, which is derived using a ray optics model for objects with small OPL gradients.
© 2008 Optical Society of America
OCIS Codes
(110.2960) Imaging systems : Image analysis
(120.3940) Instrumentation, measurement, and metrology : Metrology
(180.0180) Microscopy : Microscopy
(350.5030) Other areas of optics : Phase
(110.1758) Imaging systems : Computational imaging
ToC Category:
Microscopy
History
Original Manuscript: July 2, 2007
Revised Manuscript: November 2, 2007
Manuscript Accepted: November 11, 2007
Published: December 20, 2007
Virtual Issues
Vol. 3, Iss. 2 Virtual Journal for Biomedical Optics
Citation
Sri Rama Prasanna Pavani, Ariel R. Libertun, Sharon V. King, and Carol J. Cogswell, "Quantitative structured-illumination phase microscopy," Appl. Opt. 47, 15-24 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-1-15
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