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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 10 — Apr. 1, 2008
  • pp: 1457–1464

Simultaneous measurement of refractive index and thickness of birefringent wave plates

Yen-Liang Yeh  »View Author Affiliations


Applied Optics, Vol. 47, Issue 10, pp. 1457-1464 (2008)
http://dx.doi.org/10.1364/AO.47.001457


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Abstract

A nondestructive measurement system based on a position sensing detector (PSD) and a laser interferometer for determining the thickness and refractive indices of birefringent optical wave plates has been developed. Unlike previous methods presented in the literature, the proposed metrology system allows the refractive index and thickness properties of the optical plate to be measured simultaneously. The experimental results obtained for the e-light and o-light refractive indices of a commercially available birefringent optical wave plate with refractive indices of n o = 1.542972 and n e = 1.552033 are found to be accurate to within 0.004132 and 0.000229, respectively. Furthermore, the experimentally derived value of the wave plate thickness deviates by no more than 0.9 μm from the analytically derived value of 453.95 μm . Overall, the experimental results confirm that the proposed metrology system provides a simple yet highly accurate means of obtaining simultaneous measurements of the refractive indices and thickness of birefringent optical wave plates.

© 2008 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(290.3030) Scattering : Index measurements

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 24, 2007
Revised Manuscript: January 14, 2008
Manuscript Accepted: January 25, 2008
Published: March 27, 2008

Citation
Yen-Liang Yeh, "Simultaneous measurement of refractive index and thickness of birefringent wave plates," Appl. Opt. 47, 1457-1464 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-10-1457

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