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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 10 — Apr. 1, 2008
  • pp: 1684–1696

Quantitative phase measurements using optical quadrature microscopy

Willie S. Rockward, Anthony L. Thomas, Bing Zhao, and Charles A. DiMarzio  »View Author Affiliations


Applied Optics, Vol. 47, Issue 10, pp. 1684-1696 (2008)
http://dx.doi.org/10.1364/AO.47.001684


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Abstract

Imaging of phase or optical path length is becoming more important with the development of better imaging systems, computational algorithms, faster computers, and a greater interest in the imaging of transparent objects. Early phase imaging involved qualitative imaging of phase gradients. New computational algorithms can be used to extract some quantitative phase imaging from these techniques. In contrast, new hardware has enabled full-field quantitative phase imaging on a practical and cost-effective scale. We explore a quantitative comparison between two techniques for imaging phase. In the first technique, phase is recovered from a pair of differential interference contrast images, and in the second technique, phase is measured pixel-by-pixel interferometrically. It is shown, experimentally, that the overall results are similar, but each technique has its own advantages and disadvantages.

© 2008 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(110.4980) Imaging systems : Partial coherence in imaging
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.1790) Microscopy : Confocal microscopy
(180.3170) Microscopy : Interference microscopy

ToC Category:
Imaging Systems

History
Original Manuscript: October 8, 2007
Manuscript Accepted: January 3, 2008
Published: March 27, 2008

Virtual Issues
Vol. 3, Iss. 5 Virtual Journal for Biomedical Optics

Citation
Willie S. Rockward, Anthony L. Thomas, Bing Zhao, and Charles A. DiMarzio, "Quantitative phase measurements using optical quadrature microscopy," Appl. Opt. 47, 1684-1696 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-10-1684

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