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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 10 — Apr. 1, 2008
  • pp: B128–B138

Impact of measurement precision and noise on superresolution image reconstruction

Sally L. Wood, Shu-Ting Lee, Gao Yang, Marc P. Christensen, and Dinesh Rajan  »View Author Affiliations

Applied Optics, Vol. 47, Issue 10, pp. B128-B138 (2008)

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The performance of uniform and nonuniform detector arrays for application to the PANOPTES (processing arrays of Nyquist-limited observations to produce a thin electro-optic sensor) flat camera design is analyzed for measurement noise environments including quantization noise and Gaussian and Poisson processes. Image data acquired from a commercial camera with 8   bit and 14   bit output options are analyzed, and estimated noise levels are computed. Noise variances estimated from the measurement values are used in the optimal linear estimators for superresolution image reconstruction.

© 2008 2008 Optical Society of America

OCIS Codes
(100.6640) Image processing : Superresolution
(110.0110) Imaging systems : Imaging systems

ToC Category:
Imaging Systems

Original Manuscript: September 13, 2007
Revised Manuscript: January 2, 2008
Manuscript Accepted: February 24, 2008
Published: March 31, 2008

Sally L. Wood, Shu-Ting Lee, Gao Yang, Marc P. Christensen, and Dinesh Rajan, "Impact of measurement precision and noise on superresolution image reconstruction," Appl. Opt. 47, B128-B138 (2008)

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